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Complete Environmental Solutions
for Electron Microscopes

Achieve the high resolution and control your microscope was intended for...

Mag-NetX SEM-Base STACIS 2100 SEM-Closure
...don't let your environment limit the return on your TEM investment

With their extremely high magnifications and resolving power, electron microscopes, both scanning and transmission type, as well as focused ion-beam instruments, can be greatly impacted by their environment. Beam control in these instruments is critical for the highest quality images at high magnifications. Although high power beam instruments are engineered and manufactured to very high standards, their performance is impacted by less than ideal environments. Low frequency floor vibration can limit your resolving power. High AC magnetic fields, or fluctuations in the DC fields can result in unwanted jagged edges in images. Acoustic sound waves can excite a resonance mode in the beam column and further disrupt the control of the beam and spot size, also leading to lower resolving power. All of these environmental problems can slow your research, impact throughput in a production environment, and even lead to very undesirable downtime for the microscope.
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